SVZ Technologies has introduced additional system in its product line for the characterization and testing of semiconductor materials and devices. This new system is designed specifically for deep-level transient spectroscopy, focusing on transient capacitance measurements. The system consists of the following units:
Specifications:
| Capacitance resolution | 0.2 pF |
| Pulse Duration Range | 100 msec – 300 msec |
| Capacitance Range | 1 pF – 1uF |
| Signal Resolution | 10 bits |
| Measurement Frequency | up to 0.1 MHz |
| Calibration and Zeroing | Manual |
| Bias Voltage Range | ± 24 V |
| Data Acquisition Rate | 1 point per 200 msec |
| Max. Time Interval | 600 sec |