SVZ Technologies develops the next system in its line of products for characterization and testing of semiconductor materials and devices. The new system is intended for deep level transient spectroscopy, namely for the transient capacitance measurements. The system consists of the following units:
Specifications:
| Capacitance resolution | 0.2 pF |
| Pulse Duration Range | 100 msec – 300 msec |
| Capacitance Range | 1 pF – 1uF |
| Signal Resolution | 10 bits |
| Measurement Frequency | up to 0.1 MHz |
| Calibration and Zeroing | Manual |
| Bias Voltage Range | ± 24 V |
| Data Acquisition Rate | 1 point per 200 msec |
| Max. Time Interval | 600 sec |