The system is designed to measure semiconductor properties using the Seebeck effect.
This method involves measuring the voltage between two points on the sample surface
that have a temperature difference. The system employs two probes: one at room temperature
and the other heated to vary its temperature within a set range.
Probe overheating……………………………………….400 oC
Temperature &voltage sampling rate………………….100 ks/s
Resolution………………………………………………. 12 bits
Precision for temperature measurements…………… 0.5 oC
Sample diameter……………………………………….. 2″
Pulse amplitude…………………………………………up to 9 V
Pulse duration…………………………………………..up to 12 s