The newly developed setup is being tested and is designed to provide a semiconductor properties measurement using Seebeck effect, i.e by measuring a voltage between two points having a temperature difference, and both located on the sample surface. The system employs two probes, one having room temperature and one is heated up so that its temperature varies within a set range.
Probe overheating……………………………………….400 oC
Temperature &voltage sampling rate………………….100 ks/s
Resolution………………………………………………. 12 bits
Precision for temperature measurements…………… 0.5 oC
Sample diameter……………………………………….. 2″
Pulse amplitude…………………………………………up to 9 V
Pulse duration…………………………………………..up to 12 s