SVZ Technologies proposes an innovative approach that incorporates additional material property characteristics into standard scanning electron microscope (SEM) images, creating a more informative false-color representation. Unlike traditional methods of manually or digitally coloring grayscale SEM images, this technique reflects additional physical information acquired during electron beam scanning. this method enhances the informational content of the final image. Following the successful demonstration of this approach, we plan to begin manufacturing custom-designed versions of the system, which will acquire additional SEM data and process it into a color image of the scanned object.
Color SEM System