{"id":735,"date":"2021-11-22T01:39:49","date_gmt":"2021-11-22T07:39:49","guid":{"rendered":"http:\/\/svz-technologies.com\/?page_id=735"},"modified":"2024-08-16T17:31:21","modified_gmt":"2024-08-16T22:31:21","slug":"electron-beam-induced-current-ebic-system","status":"publish","type":"page","link":"https:\/\/svz-technologies.com\/?page_id=735","title":{"rendered":"Ultra-Low Noise High-Resolution Controller for Charge Collection Microscopy Applications"},"content":{"rendered":"\n<figure class=\"wp-block-video\"><video controls src=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/EBIC-small-v2.mp4\"><\/video><\/figure>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/02\/a-scaled.jpg\"><img decoding=\"async\" loading=\"lazy\" width=\"1024\" height=\"798\" src=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/02\/a-1024x798.jpg\" alt=\"\" class=\"wp-image-749\" srcset=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/02\/a-1024x798.jpg 1024w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/02\/a-300x234.jpg 300w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/02\/a-768x599.jpg 768w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/02\/a-1536x1197.jpg 1536w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/02\/a-2048x1596.jpg 2048w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/a><\/figure>\n\n\n\n<p><span class=\"has-inline-color has-cyan-bluish-gray-color\">SVZ Technologies has developed a new generation of EBIC systems, featuring a unique approach to EBIC and secondary electron image generation. Unlike other systems that control the electron microscope beam for image generation\u2014resulting in decreased sampling rates\u2014the SVZ Technologies EBIC system employs direct image generation using the electron microscope&#8217;s scanning capabilities. This method doubles the image generation speed and significantly minimizes sample drift, which is an inevitable issue during prolonged image generation.<\/span><\/p>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-2.jpg\"><img decoding=\"async\" loading=\"lazy\" width=\"1024\" height=\"382\" src=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-2-1024x382.jpg\" alt=\"\" class=\"wp-image-876\" srcset=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-2-1024x382.jpg 1024w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-2-300x112.jpg 300w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-2-768x287.jpg 768w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-2.jpg 1149w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/a><\/figure>\n\n\n\n<p><span class=\"has-inline-color has-cyan-bluish-gray-color\">A two-dimensional electron beam-induced current (EBIC) image is generated during the scanning of a sample that features a metal contact forming a Schottky barrier. The software enables the plotting of a current profile along an axis positioned anywhere across the image, in any orientation (horizontal, vertical, or inclined). Additionally, it facilitates the generation of a fit within a user-selected area.<\/span><\/p>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show.jpg\"><img decoding=\"async\" loading=\"lazy\" width=\"1024\" height=\"415\" src=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-1024x415.jpg\" alt=\"\" class=\"wp-image-875\" srcset=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-1024x415.jpg 1024w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-300x122.jpg 300w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show-768x311.jpg 768w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/07\/slide-show.jpg 1049w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/a><\/figure>\n\n\n\n<p><span class=\"has-inline-color has-cyan-bluish-gray-color\">SEM image of the metal contact matches its EBIC image. <\/span><\/p>\n\n\n\n<figure class=\"wp-block-image size-large\"><a href=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/10\/20220221_1718253.jpg\"><img decoding=\"async\" loading=\"lazy\" width=\"1024\" height=\"975\" src=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/10\/20220221_1718253-1024x975.jpg\" alt=\"\" class=\"wp-image-903\" srcset=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/10\/20220221_1718253-1024x975.jpg 1024w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/10\/20220221_1718253-300x286.jpg 300w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/10\/20220221_1718253-768x731.jpg 768w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/10\/20220221_1718253-1536x1463.jpg 1536w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2022\/10\/20220221_1718253-2048x1951.jpg 2048w\" sizes=\"(max-width: 1024px) 100vw, 1024px\" \/><\/a><figcaption><span class=\"has-inline-color has-cyan-bluish-gray-color\">Charge Collection Electron Microscopy Devices: <br>a) Ultra Low Noice High-Resolution EBIC Controller<br>b) Low Noise Low Drift Amplifier\/Scanbox<br>c) SVZ EBIC-2 System Controller<\/span><\/figcaption><\/figure>\n\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>SVZ Technologies has developed a new generation of EBIC systems, featuring a unique approach to EBIC and secondary electron image generation. Unlike other systems that control the electron microscope beam for image generation\u2014resulting in decreased sampling rates\u2014the SVZ Technologies EBIC system employs direct image generation using the electron microscope&#8217;s scanning capabilities. This method doubles the image generation speed and significantly minimizes sample drift, which is an inevitable issue during prolonged image generation. A two-dimensional electron beam-induced current (EBIC) image is generated during the scanning of a sample that features a metal contact forming a Schottky barrier. The software enables the plotting of a current profile along an axis positioned anywhere across the image, in any orientation (horizontal, vertical, or inclined). Additionally, it facilitates the generation of a fit within a user-selected area. SEM image of the metal contact matches its EBIC image.<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":158,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages\/735"}],"collection":[{"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=735"}],"version-history":[{"count":13,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages\/735\/revisions"}],"predecessor-version":[{"id":931,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages\/735\/revisions\/931"}],"up":[{"embeddable":true,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages\/158"}],"wp:attachment":[{"href":"https:\/\/svz-technologies.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=735"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}