{"id":603,"date":"2018-06-06T20:14:12","date_gmt":"2018-06-07T01:14:12","guid":{"rendered":"http:\/\/svz-technologies.com\/?page_id=603"},"modified":"2024-08-16T17:46:52","modified_gmt":"2024-08-16T22:46:52","slug":"seebeck-effect-setup","status":"publish","type":"page","link":"https:\/\/svz-technologies.com\/?page_id=603","title":{"rendered":"Seebeck Effect Setup"},"content":{"rendered":"<p>\u00a0<\/p>\n<p><a href=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2018\/09\/20180909_223422b.jpg\"><img decoding=\"async\" loading=\"lazy\" class=\"aligncenter size-full wp-image-609\" src=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2018\/09\/20180909_223422b.jpg\" alt=\"20180909_223422b\" width=\"3224\" height=\"2628\" srcset=\"https:\/\/svz-technologies.com\/wp-content\/uploads\/2018\/09\/20180909_223422b.jpg 3224w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2018\/09\/20180909_223422b-300x245.jpg 300w, https:\/\/svz-technologies.com\/wp-content\/uploads\/2018\/09\/20180909_223422b-1024x835.jpg 1024w\" sizes=\"(max-width: 3224px) 100vw, 3224px\" \/><\/a><\/p>\n<p>The system is designed to measure semiconductor properties using the Seebeck effect. <br \/>This method involves measuring the voltage between two points on the sample surface <br \/>that have a temperature difference. The system employs two probes: one at room temperature<br \/>\u00a0and the other heated to vary its temperature within a set range.<\/p>\n<p>Probe overheating<span style=\"color: #808080;\">&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;.<\/span>400 oC<br \/>Temperature &amp;voltage sampling rate<span style=\"color: #808080;\">&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;.<\/span>100 ks\/s<br \/>Resolution<span style=\"color: #808080;\">&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;.\u00a0<\/span>12 bits<br \/>Precision for temperature measurements<span style=\"color: #808080;\">&#8230;&#8230;&#8230;&#8230;&#8230;\u00a0<\/span>0.5 oC<br \/>Sample diameter<span style=\"color: #808080;\">&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;..\u00a0<\/span>2&#8243;<br \/>Pulse amplitude<span style=\"color: #808080;\">&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;<\/span>up to 9 V<br \/>Pulse duration<span style=\"color: #808080;\">&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;..<\/span>up to\u00a012 s<\/p>\n\n\n<p><\/p>\n","protected":false},"excerpt":{"rendered":"<p>\u00a0 The system is designed to measure semiconductor properties using the Seebeck effect. This method involves measuring the voltage between two points on the sample surface that have a temperature difference. The system employs two probes: one at room temperature\u00a0and the other heated to vary its temperature within a set range. Probe overheating&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;.400 oCTemperature &amp;voltage sampling rate&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;.100 ks\/sResolution&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;.\u00a012 bitsPrecision for temperature measurements&#8230;&#8230;&#8230;&#8230;&#8230;\u00a00.5 oCSample diameter&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;..\u00a02&#8243;Pulse amplitude&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;up to 9 VPulse duration&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;&#8230;..up to\u00a012 s<\/p>\n","protected":false},"author":1,"featured_media":0,"parent":158,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages\/603"}],"collection":[{"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/users\/1"}],"replies":[{"embeddable":true,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=%2Fwp%2Fv2%2Fcomments&post=603"}],"version-history":[{"count":12,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages\/603\/revisions"}],"predecessor-version":[{"id":940,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages\/603\/revisions\/940"}],"up":[{"embeddable":true,"href":"https:\/\/svz-technologies.com\/index.php?rest_route=\/wp\/v2\/pages\/158"}],"wp:attachment":[{"href":"https:\/\/svz-technologies.com\/index.php?rest_route=%2Fwp%2Fv2%2Fmedia&parent=603"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}